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About Sun Labs
Design Notes for Electric's Network Consistency Checker
By:
Russell Kao
,
Ivan Minevskiy
and
Jon Lexau
Report Number: TR-2006-152
Duchess Chips for Process-Specific Wire Capacitance Characterization, The
By:
Ann Coulthard
,
Jonathan Gainsley
,
Jon Lexau
and
Ivan E. Sutherland
Report Number: TR-2001-100
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